Keysight (Agilent) 3070 Test Solutions

Ikon Test Solutions provide full turnkey test solutions for Keysight (Agilent) 3070. With extensive experience and specialist knowledge in test development and production support we are able to provide maximum test coverage on a robust and production friendly fixture for your circuit boards. To ensure the highest levels of consistency, performance, throughput and quality are being achieved, all test programmes are developed and complimented by Ikon Test Solutions own range of specialist software tools and custom test libraries.

To provide maximum and superior test coverage Ikon Test Solutions have developed automatically generated testing digital clamp diodes which are embedded into the Agilent test source code during CAD processing. This method not only compliments existing digital techniques but has the added benefit of helping to reduce costs through the removal of Testjet / VTEP. Additionally, this system does not impact on the time spent testing.

Using our own in-house developed software enables us to generate and provide you with testability reports that gauge how effective our testing systems are. Additionally, so that you have an expected test coverage for any planned solution a PCOLA (Component Coverage) - SOQ (Pin Coverage) formatted and detailed report is provided for your circuit board at the quotation stage.

We also provide unbiased, expert analysis of your existing ATE solutions and can advise you on relevant fixture / programme enhancements which are available.

Ikon Test Solutions Provide:

  • (DFT) Design for Testability Reviews
  • CAD Review and CAD Data Processing
  • Test Programme Development - Simple to Complex:

Automated LED Colour and Intensity Detection
Vectorless - Testjet / VTEP
Custom Device Test Model Development - Analogue, Digital and Hybrid
Boundary Scan Testing
Cluster Testing
In System Programming - FLASH, EEPROM, CPLD, PIC etc., etc.
Functional Testing - Based on Customer Requirements and Test System Resources
Integrated or Standalone or x1149 Boundary Scan Analyser Software / Hardware Solution

  • Test Programme Quality:

Fault Coverage, Stability, Reporting (Device / Pin Level)
Gauge Repeatability and Reproducibility. (On Request - Requires 10 Gold Sample Cards for Analysis)

  • Test Programme and Fixture Documentation
  • We also Provide Onsite Support and Training

Contact Ikon Test Solutions to discuss your requirements and we will provide the perfect solution to meet your needs.


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